Predavanje: Sébastien Lalléchère – PRE- AND POST-INFERENCES FOR STATISTICAL AND PROBABILISTIC EMC RADIATED TESTS

27. listopada 2017.

od 12:00 do 14:00

Velika vijećnica, FESB

Odjel za elektromagnetsku kompatibilnost Hrvatske sekcije IEEE poziva Vas na predavanje pod naslovom:

“PRE- AND POST-INFERENCES FOR STATISTICAL AND PROBABILISTIC EMC RADIATED TESTS”

koje će na engleskom jeziku održati Sébastien Lalléchère, PhD of Université Clermont Auvergne, Sigma Clermont Institut Pascal, France.

Sadržaj predavanja:

In the framework of electromagnetics (especially for electromagnetic compatibility (EMC) and electromagnetic interferences (EMI) issues), the assessment of confidence intervals is of great concern. On the one hand, most of standards, technical requirements, and guidelines require the accurate prediction of mean, standard deviation and/or extreme quantities of interest (voltages, currents, E-/H-fields, Sparameters, impedances …), since the evaluation of margins and risks are intrinsic to EMC/EMI. On the other hand, it is well known that EMC/EMI testing configurations are, by nature, complex to handle: for instance regarding the increase of frequency bandwidth and the coexistence of multi-physics/multi-scales issues. Although EMC/EMI studies are governed by the management of margins, taking into account the stochastic nature both of inputs and outputs remains a serious bottleneck. This is mostly due to the stochastic (identification and characterization of random parameters, number of random variables …) and deterministic (computing and/or measuring costs at design and/or qualification steps). In order to tackle this problem, the state-of-the-art is rich with many stochastic techniques that have been explored by various international and recognized groups during the last decade. Among the literature, this presentation will be devoted to the presentation of reduced order models (reducing inputs complexity) and the application of bootstrap procedure (taking benefit of reduced amount of outputs). The advocated models will be presented and discussed regarding pre- and post-inferences, and they will be applied to numerical and experimental radiated EMC tests. Thus, frequency- and time-domain experiments will validate the interest (e.g. precision) of these formalisms comparatively to Monte Carlo approaches for electromagnetic field-to-system coupling configurations.

Životopis predavača:

Sébastien Lalléchère obtained his Master and PhD degrees respectively in computational modeling and electronics/electromagnetics from Polytech Clermont (2002) and Université Blaise Pascal (UBP, 2006), in Clermont-Ferrand, France. He served as research engineer in LASMEA (2007) granted by French National Research Agency (ANR) program CISSSI focusing on intensive computational methods for electromagnetics. He joined UBP, Clermont-Ferrand (France) as an Assistant Professor in September 2007, and he has been Associate Professor in Université Clermont Auvergne (UCA, since 2017) and Institut Pascal (since 2012). His research interests rely on electromagnetic compatibility (EMC) including antennas and propagation, complex and reverberating electromagnetic environments, computational electromagnetics, numerical stochastic modeling, reliability and sensitivity analysis in electrical engineering. He is actively involved in different research projects in antennas, RF and EMC, cosupervised 3 PhD students and was author or co-author of more than 120 papers in international conferences and journals. He received funding grants for visiting appointments in 2006 from French Foreign Affairs/Research Ministries for short term visit in ETH Zurich (Switzerland), and in 2014/2016 from UBP for scientific stays in University of Split (Croatia). Since October 2015, Dr. Lalléchère has been Officer Substitute of French URSI Commission E “EM environment and interferences”, and an elected member of French National Council for University (CNU in French) for electrical engineering. He is also a member of IEEE (EMC, MTT, AP societies), Applied Computational Electromagnetics Society (ACES), and of the French Electrical Engineering Society (SEE).